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<br />" . <br />. ,~. <br />',I" , , <br /> <br />Pr()JectNo.Tl17~Q3 <br />Repo.rt'Date; Apn1~2003 <br /> <br />Page 2 0(6 <br /> <br />Manufacturer: <br /> <br />Cffl:1ttmCAWN TEST. REPORT <br /> <br />GOJi'ffiLLEmERPRtSES, .INC <br />BSO WAYN:g A VB <br />tNDIANA, PA15701 <br /> <br />I'todu.tl,tdeufffic:rtiQu <br /> <br />ProdtictType: <br /> <br />Double Hung Wtridow <br /> <br />Seriesftviodel #: <br /> <br />G5l05 <br /> <br />Specification: <br /> <br />AAJvIAlNWWDA 1011I.S.2-97 <br /> <br />Designation: <br /> <br />H-R30(54" X 77") AAlv.wNW\.VDA 101/1.5.2-97 <br />GRADE 30 <br /> <br />Product Description: Attacbed <br /> <br />Test Results: <br /> <br />Attached <br /> <br />T E:st · Equipment: <br /> <br />FET <br /> <br />Testing Date: <br /> <br />3/17/03 <br /> <br />D!1ltailed assembly drawings showing wall thickness of ail members, corner construction and <br />hardwareappucation are. on Ule;mdhave been compared to the sample submitted. A copy of <br />this report wrd test sample wiI1be ret~ined at FET for a perip,d of 4 years. The results <br />obtain~dap:pry only to the-specimen tested. No condusiorisofanykindregardin:g the <br />adl~ua<;y or inadequacy of the glass in the test specimen may bedraWIi form this test. <br /> <br />TheaboveresuIt~ were secured by using the designated test methods and they indicate <br />cOriipua!lc.eWith the Perfunnance requirernents6f the referenced specification. This report <br />does nQt.CQnstitute~erti:fiC3.tiOl1 cftltispracluct, whieh.may only.l:re.grantedby the <br />certific-ationprogram administrator. <br /> <br /> <br />-;1'" ~ <br />//}/-/ <br /> <br />A.P.P.~'.'..~. ~..y: ... !... ... '/..7." <br />fJ( . I :1-~ <br />Patrick J. Fif' ~ W <br />'-'" ,... .. <br />, ~~ <br /> <br />7 <br />/ <br />! <br />